SDCViT: a transformer-powered hierarchical framework for semiconductor defect detection and classification
Shaurya Jain; A. Charan Kumari; K. Srinivas
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Journal of Intelligent Manufacturing
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s10845-026-02797-4
The original publisher provides the full text and its access options.
Cite this source
Shaurya Jain; A. Charan Kumari; K. Srinivas. SDCViT: a transformer-powered hierarchical framework for semiconductor defect detection and classification. Journal of Intelligent Manufacturing. 2026-02-06. https://doi.org/10.1007/s10845-026-02797-4