A Polarization-Sensitive ReS 2 /Si Junction Field-Effect Synaptic Transistor for Biometric Authentication and Imaging Applications
Jian Chai; Rui Yuan; Ai Chen; Xinyi Xu; Jiajun Lu; Xinwei Zhang; Jiabao Sun; Baoshi Qiao; Lingrui Zou; Pu Feng; Shukai Duan; Huan Hu; Xin He; Fei Xue; Feichi Zhou; Lingfei Li; Srikrishna Chanakya Bodepudi; Bin Yu; Yang Xu
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- ACS Applied Materials & Interfaces
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1021/acsami.5c25425
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Jian Chai; Rui Yuan; Ai Chen; Xinyi Xu; Jiajun Lu; Xinwei Zhang; Jiabao Sun; Baoshi Qiao; Lingrui Zou; Pu Feng; Shukai Duan; Huan Hu; Xin He; Fei Xue; Feichi Zhou; Lingfei Li; Srikrishna Chanakya Bodepudi; Bin Yu; Yang Xu. A Polarization-Sensitive ReS 2 /Si Junction Field-Effect Synaptic Transistor for Biometric Authentication and Imaging Applications. ACS Applied Materials & Interfaces. 2026-03-23. https://doi.org/10.1021/acsami.5c25425