Rapid early battery depletion and lead–electrode corrosion owing to CIED gate oxide semiconductor defects
Robert G. Hauser; Dawn Witt; Melanie Kapphahn-Bergs; Jay D. Sengupta
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Heart Rhythm
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.hrthm.2026.02.037
The original publisher provides the full text and its access options.
Cite this source
Robert G. Hauser; Dawn Witt; Melanie Kapphahn-Bergs; Jay D. Sengupta. Rapid early battery depletion and lead–electrode corrosion owing to CIED gate oxide semiconductor defects. Heart Rhythm. 2026-09. https://doi.org/10.1016/j.hrthm.2026.02.037