Neurosymbolic AI-Driven Zero-Defect Manufacturing in Semiconductor Assembly: A Hybrid Framework
Mukund Shenoy; Shubhada Sahasrabudhe; Farhad Ameri
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 36th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/asmc64512.2025.11010401
The original publisher provides the full text and its access options.
Cite this source
Mukund Shenoy; Shubhada Sahasrabudhe; Farhad Ameri. Neurosymbolic AI-Driven Zero-Defect Manufacturing in Semiconductor Assembly: A Hybrid Framework. 2025 36th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC). 2025-05-05. https://doi.org/10.1109/asmc64512.2025.11010401