Large Language Model-Assisted Security Testing for Embedded Systems
Xing Liu; Jian Lin; Weiyu Dong; Zhizhuo Tang; Yonghao Wang
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 International Conference on Signal Processing, Computer Networks and Communications (SPCNC)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/spcnc68200.2025.11406662
The original publisher provides the full text and its access options.
Cite this source
Xing Liu; Jian Lin; Weiyu Dong; Zhizhuo Tang; Yonghao Wang. Large Language Model-Assisted Security Testing for Embedded Systems. 2025 International Conference on Signal Processing, Computer Networks and Communications (SPCNC). 2025-12-05. https://doi.org/10.1109/spcnc68200.2025.11406662