Electrical Field Engineering of a Metal Capping Layer for Enhanced Oxide Thin-Film Transistor Performance
Balaji M
- Published
- Publisher
- Asian Research Association
- Journal / collection
- NanoNEXT
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.54392/nnxt2622
The original publisher provides the full text and its access options.
Cite this source
Balaji M. Electrical Field Engineering of a Metal Capping Layer for Enhanced Oxide Thin-Film Transistor Performance. NanoNEXT. 2026-04-18. https://doi.org/10.54392/nnxt2622