Enhancing Total-Ionizing-Dose Effects in the Partial Insulator in a Buried-Channel-Array Transistor: A Structural Proposal and Analytical Approach
Je Won Park; Dongyeong Kim; Suyeon Kim; Shinwook Kim; Jeonghyeon Yun; Chaehyuk Lim; Hyeona Seo; Sowon Kim; Juwon Lee; Hyerin Lee; Geon Kim; Jinseok Park; Seungchan Lee; Yong-Bok Lee; Sokhee P. Jung; Myoung Jin Lee
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Device and Materials Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tdmr.2024.3503576
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Je Won Park; Dongyeong Kim; Suyeon Kim; Shinwook Kim; Jeonghyeon Yun; Chaehyuk Lim; Hyeona Seo; Sowon Kim; Juwon Lee; Hyerin Lee; Geon Kim; Jinseok Park; Seungchan Lee; Yong-Bok Lee; Sokhee P. Jung; Myoung Jin Lee. Enhancing Total-Ionizing-Dose Effects in the Partial Insulator in a Buried-Channel-Array Transistor: A Structural Proposal and Analytical Approach. IEEE Transactions on Device and Materials Reliability. 2025-06. https://doi.org/10.1109/tdmr.2024.3503576