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Research literature / Conference paper

A Knowledge Assistant for Semiconductor Fault Diagnosis Using an LLM-Enhanced Case-Based Reasoning Framework

Hyunseop Park; Hyungjae Yoo; Junho Lee; Jaegun Kim; Hyunwoo Cha; Minah Park; Davin Lee; Sungmin Cho; Euisuk Kum

Published
Publisher
IEEE
Journal / collection
2025 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/ieem63636.2025.11357845

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Hyunseop Park; Hyungjae Yoo; Junho Lee; Jaegun Kim; Hyunwoo Cha; Minah Park; Davin Lee; Sungmin Cho; Euisuk Kum. A Knowledge Assistant for Semiconductor Fault Diagnosis Using an LLM-Enhanced Case-Based Reasoning Framework. 2025 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM). 2025-12-07. https://doi.org/10.1109/ieem63636.2025.11357845

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