Anomaly Detection Reliability in Consumer Electronics Manufacturing
Chuen-Wun Pai; Hung-Wei Hsueh; Shu-Han Hsu
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Consumer Electronics
- Research area
- Industrial systems
- Source type
- Journal article
- DOI
- 10.1109/tce.2025.3626738
The original publisher provides the full text and its access options.
Cite this source
Chuen-Wun Pai; Hung-Wei Hsueh; Shu-Han Hsu. Anomaly Detection Reliability in Consumer Electronics Manufacturing. IEEE Transactions on Consumer Electronics. 2025-11. https://doi.org/10.1109/tce.2025.3626738