Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads
V. Ya. Khorolsky; A. M. Isupova; K. M. Yundin; I. K. Sharipov
- Published
- Publisher
- Allerton Press
- Journal / collection
- Russian Electrical Engineering
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3103/s1068371225700464
The original publisher provides the full text and its access options.
Cite this source
V. Ya. Khorolsky; A. M. Isupova; K. M. Yundin; I. K. Sharipov. Experimental Testing of Power Semiconductor Devices for Thermal Stability under Static and Dynamic Current Overloads. Russian Electrical Engineering. 2025-05. https://doi.org/10.3103/s1068371225700464