A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention
Sharith Dhar; Fahmid Al Farid; Md Saiful Islam; Jia Uddin; Sarina Mansor
- Published
- Publisher
- Public Library of Science (PLoS)
- Journal / collection
- PLOS One
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1371/journal.pone.0346595
The original publisher provides the full text and its access options.
Cite this source
Sharith Dhar; Fahmid Al Farid; Md Saiful Islam; Jia Uddin; Sarina Mansor. A hybrid system for detecting semiconductor wafer defects using modified MobileNet with multi-head attention. PLOS One. 2026-04-08. https://doi.org/10.1371/journal.pone.0346595