Vision Transformer-Based Framework for Reliable Semiconductor Wafer Defect Classification
Ahmmad Musha; Chinmoy Modak Turjo; Tonmoy Ghosh
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 28th International Conference on Computer and Information Technology (ICCIT)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/iccit68739.2025.11491308
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Cite this source
Ahmmad Musha; Chinmoy Modak Turjo; Tonmoy Ghosh. Vision Transformer-Based Framework for Reliable Semiconductor Wafer Defect Classification. 2025 28th International Conference on Computer and Information Technology (ICCIT). 2025-12-19. https://doi.org/10.1109/iccit68739.2025.11491308