Analytical Model for Single Transistor Latch in MOSFETs
Jun-Hyoung Park; Hyun-Bin Noh; Sang-Won Lee; Seong-Yun Yun; Yang-Kyu Choi
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Electron Device Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/led.2026.3737574
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Cite this source
Jun-Hyoung Park; Hyun-Bin Noh; Sang-Won Lee; Seong-Yun Yun; Yang-Kyu Choi. Analytical Model for Single Transistor Latch in MOSFETs. IEEE Electron Device Letters. 2026. https://doi.org/10.1109/led.2026.3737574