Comparison of Thermal Properties of Power MOSFETs Made of Different Semiconductor Materials
Krzysztof Górecki; Krzysztof Posobkiewicz
- Published
- Publisher
- IEEE
- Journal / collection
- IEEE EUROCON 2025 - 21st International Conference on Smart Technologies
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/eurocon64445.2025.11073474
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Cite this source
Krzysztof Górecki; Krzysztof Posobkiewicz. Comparison of Thermal Properties of Power MOSFETs Made of Different Semiconductor Materials. IEEE EUROCON 2025 - 21st International Conference on Smart Technologies. 2025-06-04. https://doi.org/10.1109/eurocon64445.2025.11073474