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Research literature / Conference paper

Detecting Anomalies in Reviews Using Machine Learning and Deep Learning

Gopala Krishna Avula; Joshika Lakshmi Gandikota; Ila Rai; Gudipati Rajesh Naidu

Published
Publisher
IEEE
Journal / collection
2026 International Conference on Intelligent and Innovative Technologies in Computing, Electrical and Electronics (IITCEE)
Research area
AI & compute
Source type
Conference paper
DOI
10.1109/iitcee67948.2026.11394452

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Gopala Krishna Avula; Joshika Lakshmi Gandikota; Ila Rai; Gudipati Rajesh Naidu. Detecting Anomalies in Reviews Using Machine Learning and Deep Learning. 2026 International Conference on Intelligent and Innovative Technologies in Computing, Electrical and Electronics (IITCEE). 2026-01-22. https://doi.org/10.1109/iitcee67948.2026.11394452

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