Impact of the Endurance Measurement Methodology on Ferroelectric Field Effect Transistor Under the Capacitive Nondestructive Read
Omkar Phadke; Prasanna Venkatesan Ravindran; Halid Mulaosmanovic; Stefan Dünkel; Sven Beyer; Asif Khan; Suman Datta; Shimeng Yu
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2025.3552545
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Cite this source
Omkar Phadke; Prasanna Venkatesan Ravindran; Halid Mulaosmanovic; Stefan Dünkel; Sven Beyer; Asif Khan; Suman Datta; Shimeng Yu. Impact of the Endurance Measurement Methodology on Ferroelectric Field Effect Transistor Under the Capacitive Nondestructive Read. IEEE Transactions on Electron Devices. 2025-05. https://doi.org/10.1109/ted.2025.3552545