p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistor-Based Scan Driver Circuit Capable of Positive and Negative Dual Output Signals
Hye-Won Woo; Se-Hwan Na; Jung-Chul Kim; Juhn-Suk Yoo; Kook Chul Moon; Hwarim Im; Yong-Sang Kim
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2025.3632810
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Cite this source
Hye-Won Woo; Se-Hwan Na; Jung-Chul Kim; Juhn-Suk Yoo; Kook Chul Moon; Hwarim Im; Yong-Sang Kim. p-Type Low-Temperature Polycrystalline Silicon Thin-Film Transistor-Based Scan Driver Circuit Capable of Positive and Negative Dual Output Signals. IEEE Transactions on Electron Devices. 2026-01. https://doi.org/10.1109/ted.2025.3632810