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Research literature / Conference paper

Application of Passive Voltage Contrast Technology in Semiconductor Chip Failure Localization

Lu Han; Zheng Huang; Tiantian Tan; Zhiwei Fu; Gang Wang; Xiaotong Guo

Published
Publisher
IEEE
Journal / collection
2026 27th International Conference on Electronic Packaging Technology (ICEPT)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/icept71373.2026.11689978

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Lu Han; Zheng Huang; Tiantian Tan; Zhiwei Fu; Gang Wang; Xiaotong Guo. Application of Passive Voltage Contrast Technology in Semiconductor Chip Failure Localization. 2026 27th International Conference on Electronic Packaging Technology (ICEPT). 2026-08. https://doi.org/10.1109/icept71373.2026.11689978

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