Machine Learning-Based Prediction of Dielectric Breakdown Voltage in Semiconductor Materials: A Regression Framework Approach
Shaochen Cai
- Published
- Publisher
- ACM
- Journal / collection
- Proceedings of the 2025 International Symposium on Artificial Intelligence and Computational Social Sciences
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1145/3776759.3776815
The original publisher provides the full text and its access options.
Cite this source
Shaochen Cai. Machine Learning-Based Prediction of Dielectric Breakdown Voltage in Semiconductor Materials: A Regression Framework Approach. Proceedings of the 2025 International Symposium on Artificial Intelligence and Computational Social Sciences. 2025-09-19. https://doi.org/10.1145/3776759.3776815