Skip to content
Independent research & intelligence
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Journal article

Expanding super‐resolution microscopy to semiconductor materials through fluorescence contrast engineering

Ga‐eun Go; Doory Kim

Published
Publisher
Wiley
Journal / collection
Bulletin of the Korean Chemical Society
Research area
Semiconductors
Source type
Journal article
DOI
10.1002/bkcs.70212

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Ga‐eun Go; Doory Kim. Expanding super‐resolution microscopy to semiconductor materials through fluorescence contrast engineering. Bulletin of the Korean Chemical Society. 2026-09-09. https://doi.org/10.1002/bkcs.70212

Download RIS