Strained 2D Semiconductor Lateral Heterojunctions via Grayscale Thermal‐Scanning Probe Lithography
Giorgio Zambito; Giulio Ferrando; Matteo Barelli; Michele Ceccardi; Federico Caglieris; Daniele Marrè; Francesco Bisio; Francesco Buatier de Mongeot; Maria Caterina Giordano
- Published
- Publisher
- Wiley
- Journal / collection
- Small Science
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/smsc.202500404
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Cite this source
Giorgio Zambito; Giulio Ferrando; Matteo Barelli; Michele Ceccardi; Federico Caglieris; Daniele Marrè; Francesco Bisio; Francesco Buatier de Mongeot; Maria Caterina Giordano. Strained 2D Semiconductor Lateral Heterojunctions via Grayscale Thermal‐Scanning Probe Lithography. Small Science. 2026-01-12. https://doi.org/10.1002/smsc.202500404