Knowledge-Based Neural Network for Improved Low-Voltage I-V Fitting in RF Transistor Modeling
Jinyuan Cui; Qi-Jun Zhang
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/nemo66765.2026.11622069
The original publisher provides the full text and its access options.
Cite this source
Jinyuan Cui; Qi-Jun Zhang. Knowledge-Based Neural Network for Improved Low-Voltage I-V Fitting in RF Transistor Modeling. 2026 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO). 2026-07. https://doi.org/10.1109/nemo66765.2026.11622069