Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

Contact Silicon Etch Challenge in IGBT Manufacturing

Licheng Yang; Litian Xu; Zhongwei Jiang

Published
Publisher
IEEE
Journal / collection
2025 Conference of Science and Technology of Integrated Circuits (CSTIC)
Research area
Industrial systems
Source type
Conference paper
DOI
10.1109/cstic64481.2025.11017858

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Licheng Yang; Litian Xu; Zhongwei Jiang. Contact Silicon Etch Challenge in IGBT Manufacturing. 2025 Conference of Science and Technology of Integrated Circuits (CSTIC). 2025-03-24. https://doi.org/10.1109/cstic64481.2025.11017858

Download RIS