Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization
Masatoshi Kimura; Keisuke Ide; Kuan‐Ju Zhou; Atsushi Shimizu; Takayoshi Katase; Hidenori Hiramatsu; Kei Terayama; Hideo Hosono; Toshio Kamiya
- Published
- Publisher
- Wiley
- Journal / collection
- Advanced Intelligent Systems
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1002/aisy.70437
The original publisher provides the full text and its access options.
Cite this source
Masatoshi Kimura; Keisuke Ide; Kuan‐Ju Zhou; Atsushi Shimizu; Takayoshi Katase; Hidenori Hiramatsu; Kei Terayama; Hideo Hosono; Toshio Kamiya. Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization. Advanced Intelligent Systems. 2026-05-27. https://doi.org/10.1002/aisy.70437