Individual Authentication Method for Semiconductor Industry Using Optical Characteristics of Inkjet-Printed WGM-Microdisks
Naoya Tate; Wang Weiheng; Seigo Kitazaki; Jinghan Chen; Hiroaki Yoshioka; Naoki Yoshida; Kaoru Sumiya; Morihisa Hoga; Ken Takano; Shinya Takyu; Tsutomu Matsumoto
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/cleo/europe-eqec65582.2025.11110794
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Cite this source
Naoya Tate; Wang Weiheng; Seigo Kitazaki; Jinghan Chen; Hiroaki Yoshioka; Naoki Yoshida; Kaoru Sumiya; Morihisa Hoga; Ken Takano; Shinya Takyu; Tsutomu Matsumoto. Individual Authentication Method for Semiconductor Industry Using Optical Characteristics of Inkjet-Printed WGM-Microdisks. 2025 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC). 2025-06-23. https://doi.org/10.1109/cleo/europe-eqec65582.2025.11110794