Operand Measurement of metal/insulator/semiconductor structures by Voltage-applied HAXPES
Hiroshi Nohira
- Published
- Publisher
- The Japan Society of Applied Physics
- Journal / collection
- Extended Abstracts of the 2025 International Conference on Solid State Devices and Materials
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.7567/ssdm.2025.h-4-01
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Cite this source
Hiroshi Nohira. Operand Measurement of metal/insulator/semiconductor structures by Voltage-applied HAXPES. Extended Abstracts of the 2025 International Conference on Solid State Devices and Materials. 2025-09-17. https://doi.org/10.7567/ssdm.2025.h-4-01