Temperature non-uniformity of silicon carbide metal-oxide-semiconductor field-effect transistors
Jiapeng Li; Chunsheng Guo
- Published
- Publisher
- SPIE
- Journal / collection
- Fourth International Conference on Electronics Technology and Artificial Intelligence (ETAI 2025)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1117/12.3068225
The original publisher provides the full text and its access options.
Cite this source
Jiapeng Li; Chunsheng Guo. Temperature non-uniformity of silicon carbide metal-oxide-semiconductor field-effect transistors. Fourth International Conference on Electronics Technology and Artificial Intelligence (ETAI 2025). 2025-07-24. https://doi.org/10.1117/12.3068225