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Research literature / Conference paper

Comparative Analysis of TSD and NTC-Based Temperature Measurement for Power Semiconductor Modules

Eneko Agirrezabala Iradi; Ane Portillo Cancho; Miguel Lajas Garcia; Iosu Aizpuru Larrañaga; David Garrido Diez

Published
Publisher
IEEE
Journal / collection
IECON 2025 – 51st Annual Conference of the IEEE Industrial Electronics Society
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/iecon58223.2025.11221266

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Eneko Agirrezabala Iradi; Ane Portillo Cancho; Miguel Lajas Garcia; Iosu Aizpuru Larrañaga; David Garrido Diez. Comparative Analysis of TSD and NTC-Based Temperature Measurement for Power Semiconductor Modules. IECON 2025 – 51st Annual Conference of the IEEE Industrial Electronics Society. 2025-10-14. https://doi.org/10.1109/iecon58223.2025.11221266

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