Topographical Deep Learning Testing
Gianmarco De Vita
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/icst69053.2026.00014
The original publisher provides the full text and its access options.
Cite this source
Gianmarco De Vita. Topographical Deep Learning Testing. 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST). 2026-05-18. https://doi.org/10.1109/icst69053.2026.00014