Shallow Trap States Control Electrical Performance of Amorphous Oxide Semiconductor Thin‐Film Transistors
Måns J. Mattsson; Jinhan Lee; Christopher E. Malmberg; Jared Parker; Kyle T. Vogt; Hyemi Kim; Minji Hong; Pilsang Yun; Daewon Ha; Taeyoon Lee; Paul H.‐Y. Cheong; John F. Wager; Matt W. Graham
- Published
- Publisher
- Wiley
- Journal / collection
- Advanced Functional Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/adfm.78029
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Cite this source
Måns J. Mattsson; Jinhan Lee; Christopher E. Malmberg; Jared Parker; Kyle T. Vogt; Hyemi Kim; Minji Hong; Pilsang Yun; Daewon Ha; Taeyoon Lee; Paul H.‐Y. Cheong; John F. Wager; Matt W. Graham. Shallow Trap States Control Electrical Performance of Amorphous Oxide Semiconductor Thin‐Film Transistors. Advanced Functional Materials. 2026-09-02. https://doi.org/10.1002/adfm.78029