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Research literature / Conference paper

Comparative Analysis of Two 16-Term On-Wafer Calibration Methods versus 8-Term SOLT Off-Wafer for RF Transistor Characterization up to 110 GHz

Jojo Varghese; Thomas Zimmer; Tarek Bouzar; Philippine Billy; Sébastien Fregonese

Published
Publisher
IEEE
Journal / collection
2025 IEEE 7th International Conference on Emerging Electronics (ICEE)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/icee67165.2025.11409823

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Jojo Varghese; Thomas Zimmer; Tarek Bouzar; Philippine Billy; Sébastien Fregonese. Comparative Analysis of Two 16-Term On-Wafer Calibration Methods versus 8-Term SOLT Off-Wafer for RF Transistor Characterization up to 110 GHz. 2025 IEEE 7th International Conference on Emerging Electronics (ICEE). 2025-12-13. https://doi.org/10.1109/icee67165.2025.11409823

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