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Multi-modal Surrogate Model for Transistor Metrics Predictions Based on Local Layout Dependent Effects in 22nm FDSOI

Da Kyung Lee; Jeffrey Walling

Published
Publisher
IEEE
Journal / collection
2026 IEEE 69th International Midwest Symposium on Circuits and Systems (MWSCAS)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/mwscas67364.2026.11680722

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Da Kyung Lee; Jeffrey Walling. Multi-modal Surrogate Model for Transistor Metrics Predictions Based on Local Layout Dependent Effects in 22nm FDSOI. 2026 IEEE 69th International Midwest Symposium on Circuits and Systems (MWSCAS). 2026-08. https://doi.org/10.1109/mwscas67364.2026.11680722

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