Integrating Manufacturing Intelligence, Computer Vision, and Process Observation for Yield Improvement and Failure Prediction in Electronics Manufacturing
Vinit Vithalrai Shenvi; Ashutosh Sharma
- Published
- Publisher
- Syncsci Publishing Pte., Ltd.
- Journal / collection
- Research on Intelligent Manufacturing and Assembly
- Research area
- Industrial systems
- Source type
- Journal article
- DOI
- 10.25082/rima.2025.01.007
The original publisher provides the full text and its access options.
Cite this source
Vinit Vithalrai Shenvi; Ashutosh Sharma. Integrating Manufacturing Intelligence, Computer Vision, and Process Observation for Yield Improvement and Failure Prediction in Electronics Manufacturing. Research on Intelligent Manufacturing and Assembly. 2025-06-19. https://doi.org/10.25082/rima.2025.01.007