STEM EBIC Imaging of a Ferroelectric Field Effect Transistor (FeFET)
B C Regan; Tristan P O’Neill; Emmanuel Quezada; William A Hubbard; Suman Datta; Yueyun Chen
- Published
- Publisher
- Oxford University Press (OUP)
- Journal / collection
- Microscopy and Microanalysis
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1093/mam/ozag053.541
The original publisher provides the full text and its access options.
Cite this source
B C Regan; Tristan P O’Neill; Emmanuel Quezada; William A Hubbard; Suman Datta; Yueyun Chen. STEM EBIC Imaging of a Ferroelectric Field Effect Transistor (FeFET). Microscopy and Microanalysis. 2026-07. https://doi.org/10.1093/mam/ozag053.541