Investigation of MOSFET Transistor Reliability under Pulsed-RF Life Tests
Ahmed Almusallam; Mohamed Ali Belaid
- Published
- Publisher
- World Scientific and Engineering Academy and Society (WSEAS)
- Journal / collection
- WSEAS TRANSACTIONS ON ELECTRONICS
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.37394/232017.2025.16.15
The original publisher provides the full text and its access options.
Cite this source
Ahmed Almusallam; Mohamed Ali Belaid. Investigation of MOSFET Transistor Reliability under Pulsed-RF Life Tests. WSEAS TRANSACTIONS ON ELECTRONICS. 2025-10-07. https://doi.org/10.37394/232017.2025.16.15