Siamese network for insulated gate bipolar transistor welding layer localization in computed laminography images using sharpness guidance
Yan Li; Shuangquan Liu; Cunfeng Wei; Baodong Liu; Chao Fan
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Engineering Applications of Artificial Intelligence
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.engappai.2026.114677
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Cite this source
Yan Li; Shuangquan Liu; Cunfeng Wei; Baodong Liu; Chao Fan. Siamese network for insulated gate bipolar transistor welding layer localization in computed laminography images using sharpness guidance. Engineering Applications of Artificial Intelligence. 2026-07. https://doi.org/10.1016/j.engappai.2026.114677