Using electrical noise to improve dependability of semiconductor devices
B. I. Yakubovich
- Published
- Publisher
- Journal Dependability
- Journal / collection
- Dependability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.21683/1729-2646-2026-26-3-30-37
The original publisher provides the full text and its access options.
Cite this source
B. I. Yakubovich. Using electrical noise to improve dependability of semiconductor devices. Dependability. 2026-09-06. https://doi.org/10.21683/1729-2646-2026-26-3-30-37