Performance Investigation and Characterization of High Semiconductor Devices using ERSC
Aman Keshari; Mohammad Asif Ali; Dogga Raveendhra; Suneel Raju Pendem; B L Narasimharaju
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE 4th International Conference on Smart Technologies for Power, Energy and Control (STPEC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/stpec66316.2025.11490858
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Cite this source
Aman Keshari; Mohammad Asif Ali; Dogga Raveendhra; Suneel Raju Pendem; B L Narasimharaju. Performance Investigation and Characterization of High Semiconductor Devices using ERSC. 2025 IEEE 4th International Conference on Smart Technologies for Power, Energy and Control (STPEC). 2025-12-10. https://doi.org/10.1109/stpec66316.2025.11490858