Microstructured anisotropic PDMS sheet for damage-free electrical testing of semiconductor packages
Yulim Seol; Jaeheon Jeong; Ji-Hye Shim; Hak-Sung Kim; Hongyun So
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Sensors and Actuators A: Physical
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.sna.2025.117393
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Cite this source
Yulim Seol; Jaeheon Jeong; Ji-Hye Shim; Hak-Sung Kim; Hongyun So. Microstructured anisotropic PDMS sheet for damage-free electrical testing of semiconductor packages. Sensors and Actuators A: Physical. 2026-03. https://doi.org/10.1016/j.sna.2025.117393