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Cryogenic 22nm FD-SOI Circuit Measurements and Compact Modeling L-UTSOI: From Transistor-Level Effects to System Performance

Brian Martinez; Miltiadis Alepidis; Baptiste Jadot; Franck Badets; Yvain Thonnart; Xavier Jehl

Published
Publisher
IEEE
Journal / collection
2025 IEEE European Solid-State Electronics Research Conference (ESSERC)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/esserc66193.2025.11213957

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Brian Martinez; Miltiadis Alepidis; Baptiste Jadot; Franck Badets; Yvain Thonnart; Xavier Jehl. Cryogenic 22nm FD-SOI Circuit Measurements and Compact Modeling L-UTSOI: From Transistor-Level Effects to System Performance. 2025 IEEE European Solid-State Electronics Research Conference (ESSERC). 2025-09-08. https://doi.org/10.1109/esserc66193.2025.11213957

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