Versatile system for photoconductance decay measurement across a wide range of semiconductor materials
András Bojtor; Dávid Krisztián; Gábor Paráda; Ferenc Korsós; Sándor Kollarics; Gábor Csősz; Bence G. Márkus; László Forró; Ferenc Simon
- Published
- Publisher
- American Physical Society (APS)
- Journal / collection
- Physical Review Applied
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1103/pdrr-tpcm
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Cite this source
András Bojtor; Dávid Krisztián; Gábor Paráda; Ferenc Korsós; Sándor Kollarics; Gábor Csősz; Bence G. Márkus; László Forró; Ferenc Simon. Versatile system for photoconductance decay measurement across a wide range of semiconductor materials. Physical Review Applied. 2026-01-23. https://doi.org/10.1103/pdrr-tpcm