Research on optical inspection alignment system for semiconductor packaging printing machine
Ziwen Wu; Chenghao Zhang; Jinbo Chen; Linyong Sheng; Yong Chen
- Published
- Publisher
- SPIE
- Journal / collection
- Second International Conference on Optoelectronic Information and Optical Engineering (OIOE 2025)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1117/12.3068518
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Cite this source
Ziwen Wu; Chenghao Zhang; Jinbo Chen; Linyong Sheng; Yong Chen. Research on optical inspection alignment system for semiconductor packaging printing machine. Second International Conference on Optoelectronic Information and Optical Engineering (OIOE 2025). 2025-06-10. https://doi.org/10.1117/12.3068518