Sub-class discovery in semiconductor defect detection through clustering and few-shot learning
Young-Mok Bae; Yingdong He; Zhen He; Kwang-Jae Kim
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Expert Systems with Applications
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.eswa.2026.131353
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Cite this source
Young-Mok Bae; Yingdong He; Zhen He; Kwang-Jae Kim. Sub-class discovery in semiconductor defect detection through clustering and few-shot learning. Expert Systems with Applications. 2026-05. https://doi.org/10.1016/j.eswa.2026.131353