Enhancement Technologies for Critical Breakdown Electric Field in Silicon-Based Power Semiconductor Devices
Baoxing Duan; Jidong Jiao; Haitao Song; Yintang Yang
- Published
- Publisher
- Informa UK Limited
- Journal / collection
- IETE Technical Review
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1080/02564602.2026.2664114
The original publisher provides the full text and its access options.
Cite this source
Baoxing Duan; Jidong Jiao; Haitao Song; Yintang Yang. Enhancement Technologies for Critical Breakdown Electric Field in Silicon-Based Power Semiconductor Devices. IETE Technical Review. 2026-04-30. https://doi.org/10.1080/02564602.2026.2664114