Comparative Investigation of Undoped and Doped Profile of Hexagonal Double Gate Junctionless Field Effect Transistor
Panchita Saikia; Apurba Kumar Raibaruah; Kaushik Chandra Deva Sarma
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE Guwahati Subsection Conference (GCON)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/gcon69192.2026.11648819
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Cite this source
Panchita Saikia; Apurba Kumar Raibaruah; Kaushik Chandra Deva Sarma. Comparative Investigation of Undoped and Doped Profile of Hexagonal Double Gate Junctionless Field Effect Transistor. 2026 IEEE Guwahati Subsection Conference (GCON). 2026-06. https://doi.org/10.1109/gcon69192.2026.11648819