Analysis and Performance Limits of Si/SiGe Bipolar Transistor Collector Profiles at Reduced Temperatures
Justin P. Heimerl; Jeffrey W. Teng; John D. Cressler
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2026.3693663
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Cite this source
Justin P. Heimerl; Jeffrey W. Teng; John D. Cressler. Analysis and Performance Limits of Si/SiGe Bipolar Transistor Collector Profiles at Reduced Temperatures. IEEE Transactions on Electron Devices. 2026-07. https://doi.org/10.1109/ted.2026.3693663