Experiments of a Novel Junction Field-Effect Transistor With Dual-Controlled 3-D Gates
Nailong He; Teng Liu; Yuxiao Kun; Jiawei Wang; Xiaofeng Lai; Hao Wang; Ting Wang; Ziao Zhang; Liang Song; Sen Zhang; Jie Ma; Long Zhang; Shiyang Liu; Weifeng Sun
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2026.3704327
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Cite this source
Nailong He; Teng Liu; Yuxiao Kun; Jiawei Wang; Xiaofeng Lai; Hao Wang; Ting Wang; Ziao Zhang; Liang Song; Sen Zhang; Jie Ma; Long Zhang; Shiyang Liu; Weifeng Sun. Experiments of a Novel Junction Field-Effect Transistor With Dual-Controlled 3-D Gates. IEEE Transactions on Electron Devices. 2026-08. https://doi.org/10.1109/ted.2026.3704327