The p-type defect and electrical conductivity in wide gap semiconductor Ba2GeSe4
Yuhang Deng; Jiayuan Wang; Wanting Chen; Liu Yang; Shuaiwei Fan
- Published
- Publisher
- Elsevier BV
- Research area
- Semiconductors
- Source type
- Preprint / posted paper
- DOI
- 10.2139/ssrn.6668905
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Cite this source
Yuhang Deng; Jiayuan Wang; Wanting Chen; Liu Yang; Shuaiwei Fan. The p-type defect and electrical conductivity in wide gap semiconductor Ba2GeSe4. Elsevier BV. 2026. https://doi.org/10.2139/ssrn.6668905