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Radiation Evaluation of the TPS7H502X-SP Radiation-Hardness-Assured (RHA) Single-Ended PWM Controller with Integrated Silicon (Si) and Gallium Nitride (GaN) Field Effect Transistor (FET) Gate Driver

T. Lew; E. Johnson; A. Marinelarena

Published
Publisher
IEEE
Journal / collection
2025 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2025 NSREC)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/redw68988.2025.11534024

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T. Lew; E. Johnson; A. Marinelarena. Radiation Evaluation of the TPS7H502X-SP Radiation-Hardness-Assured (RHA) Single-Ended PWM Controller with Integrated Silicon (Si) and Gallium Nitride (GaN) Field Effect Transistor (FET) Gate Driver. 2025 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2025 NSREC). 2025-07-14. https://doi.org/10.1109/redw68988.2025.11534024

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