Terahertz high electron mobility transistor characterization and on-wafer measurement
Dong Xiong; Jing Bai; Yuan-Ting Lyu; Ao Zhang; Jian-Jun Gao
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Microelectronics Journal
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.mejo.2025.106846
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Cite this source
Dong Xiong; Jing Bai; Yuan-Ting Lyu; Ao Zhang; Jian-Jun Gao. Terahertz high electron mobility transistor characterization and on-wafer measurement. Microelectronics Journal. 2025-11. https://doi.org/10.1016/j.mejo.2025.106846